Nano-scale characterization of materials by atom probe field ion microscopy.
نویسندگان
چکیده
منابع مشابه
Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy
Recent progress in atom probe field ion microscopy (APFIM) and its applications to nanoscale microstructural studies of metallic materials are reviewed. By employing a three dimensional atom probe (3DAP), it is possible to map out elemental distributions in the real space with almost an atomic resolution, and chemical analysis of interfaces and nanoparticles can be made with improved accuracy i...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملan overview of scanning near-field optical microscopy in characterization of nano-materials
scanning near-field optical microscopy (snom) is a member of scanning probe microscopes (spms) family which enables nanostructure investigation of the surfaces on a wide range of materials. in fact, snom combines the spm technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. in this paper, a qualified overview of ...
متن کاملAutomated atom-by-atom 3D reconstruction of field ion microscopy data
An automated procedure has been developed for the 3D reconstruction of field ion microscopy (FIM) data that maintains the atomistic nature of the technique. FIM characterises individual atoms on the surface of a specimen, that is evolving subject to the process of field evaporation, in a series of 2D time-ordered images. It’s unique spatial resolution enables the direct imaging of crystal defec...
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ژورنال
عنوان ژورنال: Journal of Japan Institute of Light Metals
سال: 1992
ISSN: 0451-5994
DOI: 10.2464/jilm.42.236